Choose the measurement, then configure the instrument
From laser power and beam quality to detector noise and material response. Explore all 20 categories with technical specifications, measurement methods, configuration guidance and Precisometer PDF datasheets.
Power, spectrum, beam quality, timing, coherence, polarisation and optical-output noise.
Compare 48 laser power meters across thermopile, handheld, photodiode, integrating-sphere and USB configurations. Explore product photos, sensor and display drawings, model-specific specifications and downloadable datasheets.
Specifications & configuration
Choose among six fibre-optic spectrometers for laser wavelength, linewidth and spectral measurements. Model links open the detailed spectroscopy pages in new tabs.
Specifications & configuration
Compare 49 beam profilers across basic, infrared, medium-power, high-power and microfocus series. Explore product photos, beam-analysis examples, mechanical drawings and model-specific specifications with downloadable datasheets.
Specifications & configuration
Convert a pulsed optical signal into an electrical waveform for an oscilloscope. Choose a biased D-series detector for fast pulse monitoring or a DA-series amplified detector for fixed-gain signal acquisition, with free-space and fibre-adapter options.
Specifications & configuration
A portable electrical signal source for waveform timing, pulse trains and synchronised control of light sources. SIG100 provides three operating interfaces, an LCD, PC control and an external rechargeable battery.
Specifications & configuration
Assess temporal coherence by splitting the laser into two arms and observing fringe contrast as the optical path difference changes. Available configurations cover 200-1100 nm and nominal maximum test lengths of 2 m or 50 m.
Specifications & configuration
Measure transmitted power as a Glan analyser rotates through 360°. The angle-dependent trace supports assessment of linear-polarisation orientation and polarisation purity, with wavelength-specific prism options.
Specifications & configuration
Resolve the fine spectral structure of a continuous laser with a scanning confocal Fabry-Perot interferometer. The system combines an optical cavity, photodiode detector and piezoelectric scan controller.
Specifications & configuration
Compact thermopile and photodiode power-sensor modules for monitoring and feedback inside laser-processing equipment and test systems. Choose the spectral response, active area and electrical output together.
Specifications & configuration
Automate beam-quality measurements for CW and pulsed lasers using a motorised scan, beam profiler and analysis software. Measure M², divergence, focus diameter, waist position and Rayleigh length over the configured optical path.
Specifications & configuration
Monitor laser intensity fluctuations with an attenuated silicon-photodetector signal and oscilloscope. This is an optical-output noise setup, distinct from the STA-LFNT device-current noise system.
Specifications & configurationComputational imaging, crystal absorption, phase transitions, device response, current noise and imaging optics.
Reconstruct a spatial image from known illumination patterns and the total intensity measured by a single-pixel detector. STA-CIS combines a stable 532 nm laser, computer-controlled spatial light modulation and reconstruction software.
Specifications & configuration
Measure crystal transmission and derive absorption behaviour by monitoring optical power before and after the sample. A dual-path layout tracks laser-power changes during the measurement, with wavelength and sample mounting selected for the crystal.
Specifications & configuration
Track the optical transmission of a VO₂ sample as laser irradiation changes its state. STA-VOP uses dual-path power monitoring and a sample-specific fixture to collect real-time transmission data for phase-transition research.
Specifications & configuration
A modular optical-test platform combining a collimator, multi-spectral target generator, precision rotation stage and image analyser. Configure UV, visible, SWIR, MWIR or LWIR paths for MTF and imaging-performance measurements.
Specifications & configuration
A modular characterisation platform for photodetectors, photovoltaic cells and semiconductor thin films. Combine controlled monochromatic illumination with low-current acquisition to measure I-V, I-T, responsivity, quantum efficiency, transient response and noise.
Specifications & configuration
Measure low-frequency and ultra-low-frequency noise, 1/f spectra and random-telegraph noise in photodetectors, sensors and emerging semiconductor devices. STA-LFNT combines a compact optical platform, low-noise current amplifier, spectrum analyser and microscope.
Specifications & configurationWavelength-specific protective filters, viewing cards and vibration-test configurations.
Compare 24 protective-filter configurations by wavelength-specific optical density, visible-light transmission and listed protection markings. The range includes UV, visible, near-IR, mid-IR, CO₂ and IPL options.
Specifications & configuration
Make an otherwise invisible beam spot visible for alignment and positioning. Choose a ceramic IR viewer or a wavelength-specific plastic UV, IR or mid-IR viewer, with the active area suited to the beam.
Specifications & configuration
Simulate single-frequency and swept-frequency vibration in vertical, horizontal or combined directions for product and transport-environment testing. The listed vertical and horizontal machines have different acceleration ratings.
Specifications & configurationDiscuss optical-filter and coating tests, crystal-property measurements, spectral characterisation or a measurement system tailored to your experiment. Share the sample, test conditions and required result so we can confirm the method, equipment and deliverables.
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