CCD and CMOS sensor evaluation
DSR900 Camera Characterisation System
DSR900 automates camera and imaging-sensor characterisation with uniform monochromatic illumination, a dark enclosure and analysis software. Supports EMVA 1288 measurement workflows for visible and near-infrared cameras.
- CCD & CMOS
- Camera types
- EMVA 1288
- Workflow
- 200 mm diameter
- Monochromatic sphere
- ≥ 2000 × 1500 × 1450 mm
- Dark enclosure
Overview
About the DSR900
DSR900 integrates a tunable monochromatic source, uniform broadband illumination and a dark enclosure with motorised positioning. Automated acquisition and reports support repeatable camera and sensor comparisons.
The monochromator is specified over 200–2500 nm, while the monochromatic integrating sphere is specified for 250–2500 nm. Usable system coverage depends on all selected optical components and the camera response.
Features
- Automated image capture, processing and test reports
- Temporal and fixed-pattern noise, linearity and dynamic range
- Non-uniformity correction and defective-pixel location
Applications
- CCD and CMOS camera evaluation
- Visible and near-infrared sensor development
- Camera performance comparison and calibration
Technical data
Specifications & Configuration
| Source | 150 W xenon lamp |
|---|---|
| Source and monochromator range | 200–2500 nm |
| Monochromator focal length | 320 mm; f/4.2 |
| Resolution | 0.08 nm with a 1200 lines/mm grating |
| Adjustable bandwidth | 0.5–12 nm |
| Integrating sphere | 200 mm internal diameter; coating range 250–2500 nm |
| Sphere port | ≥ 10 mm |
| Dark enclosure | At least 2000 × 1500 × 1450 mm |
|---|---|
| Positioning | Optical-axis travel > 100 mm; vertical travel 100 mm |
| Broadband field uniformity | ≤ 1% within a 100 mm diameter field |
| Analysis | Noise, responsivity, detectivity, dynamic range, linearity, non-uniformity and defective pixels |
Download the datasheet
Measurements, specifications and configuration options.
Related Photoelectric Systems
Detector spectral responsivity
DSR600
DSR600 automates spectral responsivity and quantum efficiency characterisation for UV, visible and near-infrared detectors. Configurations cover 200–2500 nm and support photovoltaic devices, bias-dependent I–V and tandem-cell EQE measurements.
- Configured coverage
- 200–2500 nm
- Primary measurements
- SR & QE
- Electrical tests
- Light / dark I–V
Single-photon detector calibration
DSR600-PDE
DSR600-PDE measures photon detection efficiency versus wavelength by comparing a photon-counting detector with a calibrated reference through an integrating sphere. Supports SPAD, SiPM, PMT and other single-photon-sensitive detectors.
- Standard wavelength range
- 300–1100 nm
- Extended option
- To 2500 nm
- Measurements
- PDE, SR & EQE
Microdevice photoelectric characterisation
DSR300
DSR300 is a microscope-based platform for spectral responsivity, external quantum efficiency, photocurrent mapping and response-rate measurements. A 40 µm probe spot targets small detector areas and microstructured devices.
- Probe spot
- 40 µm
- Measurements
- SR & EQE
- Spatial testing
- LBIC mapping
Configure the DSR900 for your experiment
Tell us your sample size, wavelength range and measurement requirements for a configuration and quotation.
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