Microdevice photoelectric characterisation
DSR300 Microdevice Spectral Response System
DSR300 is a microscope-based platform for spectral responsivity, external quantum efficiency, photocurrent mapping and response-rate measurements. A 40 µm probe spot targets small detector areas and microstructured devices.
- 40 µm
- Probe spot
- SR & EQE
- Measurements
- LBIC mapping
- Spatial testing
- 200 ms
- I–t resolution
Overview
About the DSR300
DSR300 combines spectral scanning, photocurrent mapping and temporal measurements around a microscope and adjustable probe station. The small probe spot supports absolute responsivity measurements on detector areas of approximately hundreds of micrometres.
Source options include xenon, halogen, semiconductor lasers, picosecond lasers and supercontinuum sources. Wavelength coverage and response-rate capability depend on the selected optical and acquisition configuration.
Features
- Three-dimensional sample and probe adjustment
- Monochromatic and variable-power I–V measurements
- I–t sweeps under different irradiance and bias conditions
Applications
- Micro- and nanoscale photodetector development
- Two-dimensional materials and semiconductor devices
- Spatial uniformity, linearity and response-rate measurements
Technical data
Specifications & Configuration
| Probe spot | 40 µm |
|---|---|
| Spectral measurements | Absolute spectral responsivity and external quantum efficiency |
| Electrical measurements | Monochromatic / variable-power I–V; I–t under optical and electrical bias |
| Published I–t resolution | 200 ms; separate response-rate tests depend on configuration |
| Mapping | LBIC / photocurrent mapping |
| Sample positioning | Three-dimensional adjustable probe station |
| Sources | Xenon, halogen, supercontinuum, picosecond and semiconductor laser options |
Download the datasheet
Measurements, specifications and configuration options.
Related Photoelectric Systems
Microscopic LBIC mapping
DSR500-LBIC
DSR500-LBIC uses a galvanometer-scanned microscope to record local photocurrent and I–V curves while the sample remains stationary. The standard 20× objective provides a 260 × 200 µm scan field, with selectable scan steps down to 0.2 µm.
- Scan field at 20×
- 260 × 200 µm
- Minimum scan step
- 0.2 µm
- Laser spot
- 2 µm
Detector spectral responsivity
DSR600
DSR600 automates spectral responsivity and quantum efficiency characterisation for UV, visible and near-infrared detectors. Configurations cover 200–2500 nm and support photovoltaic devices, bias-dependent I–V and tandem-cell EQE measurements.
- Configured coverage
- 200–2500 nm
- Primary measurements
- SR & QE
- Electrical tests
- Light / dark I–V
Transient photocurrent and photovoltage
DSR800
DSR800 uses pulsed optical excitation and configurable acquisition to measure transient photocurrent, photovoltage and response times. Microscope optics, selectable lasers and probe fixtures support detector and photovoltaic dynamics experiments.
- Acquisition options
- 4 ns–400 ps
- Channels
- 2 or 4
- Sampling option
- 2.5 GS/s
Configure the DSR300 for your experiment
Tell us your sample size, wavelength range and measurement requirements for a configuration and quotation.
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