Detector spectral responsivity
DSR600 Spectral Responsivity Calibration System
DSR600 automates spectral responsivity and quantum efficiency characterisation for UV, visible and near-infrared detectors. Configurations cover 200–2500 nm and support photovoltaic devices, bias-dependent I–V and tandem-cell EQE measurements.
- 200–2500 nm
- Configured coverage
- SR & QE
- Primary measurements
- Light / dark I–V
- Electrical tests
- Bias-light EQE
- Tandem cells
Overview
About the DSR600
DSR600 records photocurrent as a function of wavelength and calculates spectral responsivity and quantum efficiency against calibrated references. Source and detector selections determine the usable range for each experiment.
Selective bias illumination enables subcell EQE measurements in tandem photovoltaics. Reflectance, transmittance and device stability measurements extend the characterisation workflow.
Features
- Automated spectral scanning and calculation
- Internal and external quantum efficiency with integrated Jsc
- Optical and electrical bias measurements
Applications
- Si, Ge, InGaAs, GaN, SiC and wide-bandgap detectors
- Perovskite, silicon and organic photovoltaics
- Tandem-cell subcell response and device stability
Technical data
Specifications & Configuration
| Configured wavelength coverage | 200–2500 nm, depending on selected sources and reference detectors |
|---|---|
| Spectral measurements | Photocurrent, spectral responsivity, EQE and IQE |
| Photovoltaic analysis | Integrated Jsc and tandem subcell EQE with bias illumination |
| Electrical measurements | Light and dark I–V under applied bias |
| Additional functions | Device stability, reflectance and transmittance |
Download the datasheet
Measurements, specifications and configuration options.
Related Photoelectric Systems
Microdevice photoelectric characterisation
DSR300
DSR300 is a microscope-based platform for spectral responsivity, external quantum efficiency, photocurrent mapping and response-rate measurements. A 40 µm probe spot targets small detector areas and microstructured devices.
- Probe spot
- 40 µm
- Measurements
- SR & EQE
- Spatial testing
- LBIC mapping
Single-photon detector calibration
DSR600-PDE
DSR600-PDE measures photon detection efficiency versus wavelength by comparing a photon-counting detector with a calibrated reference through an integrating sphere. Supports SPAD, SiPM, PMT and other single-photon-sensitive detectors.
- Standard wavelength range
- 300–1100 nm
- Extended option
- To 2500 nm
- Measurements
- PDE, SR & EQE
Solar-cell EQE, IQE and IPCE
SCS600
SCS600 measures spectral response and quantum efficiency with reflective optics, camera-assisted alignment and AC/DC acquisition. Xenon, tungsten-halogen and dual-source configurations support different wavelength ranges.
- Published measurement range
- 250–1700 nm
- Dual-source option
- To 2500 nm
- Minimum spot
- ≤ 1 mm
Configure the DSR600 for your experiment
Tell us your sample size, wavelength range and measurement requirements for a configuration and quotation.
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