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Solar-cell EQE, IQE and IPCE

SCS600 Solar Cell Quantum Efficiency System

SCS600 measures spectral response and quantum efficiency with reflective optics, camera-assisted alignment and AC/DC acquisition. Xenon, tungsten-halogen and dual-source configurations support different wavelength ranges.

SCS600 Solar Cell Quantum Efficiency System
Best for: Spectral characterisation of silicon, organic, perovskite and tandem solar cells.
250–1700 nm
Published measurement range
To 2500 nm
Dual-source option
≤ 1 mm
Minimum spot
AC & DC
Acquisition

Overview

About the SCS600

SCS600 measures EQE, IQE, IPCE and spectral responsivity and calculates short-circuit current density. Reflective optics limit chromatic changes in the measurement spot, with camera monitoring for alignment.

Bias light and electrical bias support device-dependent measurements. A glovebox accessory and a dedicated tandem-cell enclosure are available for experiments requiring controlled environments or selective subcell illumination.

Features

  • Camera view of the illumination spot and sample
  • Bias-light and bias-voltage measurements
  • LBIC capability and AC/DC signal acquisition

Applications

  • Photovoltaic spectral response and current-density calculation
  • Tandem-cell subcell characterisation with suitable bias light
  • Glovebox and vacuum-environment measurements with accessories

Technical data

Specifications & Configuration

Measurement and optics
MeasurementsEQE, IQE, IPCE, spectral responsivity, integrated Jsc and LBIC
General measurement range250–1700 nm; extended coverage depends on source and reference detectors
Minimum spot diameter≤ 1 mm
Optical designReflective measurement optics with camera monitoring
SourcesXenon, tungsten-halogen or dual source
BiasOptical bias and electrical bias supported
Source-meter options2612B and 2636B configurations available

Available configurations

SCS600-XE
Xenon source; published repeatability ≤ 2% at 200–400 nm, ≤ 1% at 400–1000 nm and ≤ 1.5% at 1000–1700 nm.
SCS600-TH
Tungsten-halogen source; published repeatability ≤ 1% at 400–1000 nm and ≤ 1.5% at 1000–1700 nm.
SCS600-XT
Dual source; published repeatability extends to 2500 nm. Figures are measured using the corresponding reference detectors at saturation.

Download the datasheet

Measurements, specifications and configuration options.

SCS600 datasheet (PDF)

Configure the SCS600 for your experiment

Tell us your sample size, wavelength range and measurement requirements for a configuration and quotation.

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