Single-photon detector calibration
DSR600-PDE Photon Detection Efficiency System
DSR600-PDE measures photon detection efficiency versus wavelength by comparing a photon-counting detector with a calibrated reference through an integrating sphere. Supports SPAD, SiPM, PMT and other single-photon-sensitive detectors.
- 300–1100 nm
- Standard wavelength range
- To 2500 nm
- Extended option
- PDE, SR & EQE
- Measurements
- Si / InGaAs
- Reference detectors
Overview
About the DSR600-PDE
A monochromator and integrating sphere provide uniform monochromatic light to the calibrated reference and device under test. Reference power and active-area ratio establish incident photon flux, which is compared with the recorded pulse count.
Scanning wavelength yields the PDE spectrum, peak efficiency and peak wavelength. The calibrated detector range and counting electronics must match the device being measured.
Features
- Wavelength-resolved PDE, spectral responsivity and EQE
- Calibrated silicon and InGaAs reference-detector options
- Configurable pulse counting, source meter and bias supplies
Applications
- SPAD and Geiger-mode APD calibration
- SiPM and multi-pixel photon-counter evaluation
- Photon-counting PMT and superconducting detector characterisation
Technical data
Specifications & Configuration
| Wavelength range | 300–1100 nm; extendable to 2500 nm with appropriate configuration |
|---|---|
| Si reference detector | 300–1100 nm with calibration certificate |
| InGaAs reference detector | 900–1700 nm or 900–2500 nm with calibration certificate |
| Acquisition options | 2 or 4 channels; 4 ns, 2 ns, 1.14 ns, 800 ps or 400 ps options |
| Published sampling-rate option | 2.5 GS/s |
| Source meter | 10 nA–1 A range; 100 fA resolution; 0–200 V source |
| Programmable supply | Dual-channel 0–32 V; 1 mV resolution |
Download the datasheet
Measurements, specifications and configuration options.
Related Photoelectric Systems
Detector spectral responsivity
DSR600
DSR600 automates spectral responsivity and quantum efficiency characterisation for UV, visible and near-infrared detectors. Configurations cover 200–2500 nm and support photovoltaic devices, bias-dependent I–V and tandem-cell EQE measurements.
- Configured coverage
- 200–2500 nm
- Primary measurements
- SR & QE
- Electrical tests
- Light / dark I–V
Transient photocurrent and photovoltage
DSR800
DSR800 uses pulsed optical excitation and configurable acquisition to measure transient photocurrent, photovoltage and response times. Microscope optics, selectable lasers and probe fixtures support detector and photovoltaic dynamics experiments.
- Acquisition options
- 4 ns–400 ps
- Channels
- 2 or 4
- Sampling option
- 2.5 GS/s
CCD and CMOS sensor evaluation
DSR900
DSR900 automates camera and imaging-sensor characterisation with uniform monochromatic illumination, a dark enclosure and analysis software. Supports EMVA 1288 measurement workflows for visible and near-infrared cameras.
- Camera types
- CCD & CMOS
- Workflow
- EMVA 1288
- Monochromatic sphere
- 200 mm diameter
Configure the DSR600-PDE for your experiment
Tell us your sample size, wavelength range and measurement requirements for a configuration and quotation.
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