Quantitative imaging at base temperature
Capacitive feedback ties image pixels to real distances rather than to applied voltage.
Opto-Mechanics · Cryogenic Piezo Stages - Closed-loop Ultra scanners
Scanner25-z.Ultra.UHV.ULT
Closed-loop Ultra Z-axis scanner; 25 x 25 x 10.5 mm body; 55 um range per axis at 300 K, 30 um at 4 K; 250 g payload; integrated capacitive displacement sensor, 0.5 nm resolution, ~0.1 % linearity, <5 nm repeatability; max. 75 V @300 K / 150 V @4 K; combined UHV plus ultra-low-temperature grade down to 30 mK; use with MC-ArchimedesLT.03.Ultra controller.
Datasheet (PDF) ↗CAD Model (STEP) ↗Catalog context
Where Scanner25-z.Ultra.UHV.ULT fits
Scanner25-z.Ultra.UHV.ULT is listed in the Cryogenic Piezo Stages - Closed-loop Ultra scanners family. The local catalog record provides these first selection fields: Active axes: Z; Footprint × hight: 25 x 25 x 10.5 mm; Mass: 80 g.
Specifications
| Active axes | Z |
|---|---|
| Footprint × hight | 25 x 25 x 10.5 mm |
| Mass | 80 g |
| Work Environment | Default: 1.4 K~ 400 K, 1e-7 mbar, 35 Tesla |
| Option 1 - 30 mK | .ULT / .UHV.ULT |
| Option 2 - 2e-11 mbar | .UHV / .UHV.ULT |
| Mainbody | Default: Pure Ti, ULT: BeCu |
| Wires | Twisted paired wire & triax cable |
| Connectors | 2 head pins + 1 triax connector (for each dimension) |
| Travel range | @300 K: 55 um; @4 K: 30 um |
| Drive Voltage | Max. 75 V @300 K, Max. 150 V @4 K |
| Max. Load | 250 g |
| Capacitance @300 K | 7 uF |
| Sensor | Capacitive displacement sensor |
| Resolution | 0.5 nm |
| Linearity error | Typical ~0.1 % |
| Repeatibility | <5 nm |
Application context
Why this design is used
Cryogenic AFM and STM raster
Deliver linear, drift-corrected scan under a probe head operating below 4 K.
Repeat-visit measurement
Return to the same coordinate across thermal cycles and long measurement campaigns.
System integration
Integration and compatibility
Use these checks to connect Scanner25-z.Ultra.UHV.ULT to the surrounding optical, mechanical and control system. Every value shown is taken from this model's own specification record.
- Travel and resolution
- Travel range: @300 K: 55 um; @4 K: 30 um · Resolution: 0.5 nm
- Separate travel from resolution and both from repeatability. Repeatability is what an automated sequence actually depends on, and it is the figure most often absent from a headline specification.
- Drive and feedback
- Sensor: Capacitive displacement sensor
- Pair open-loop mechanics with the specified high-voltage or inertial driver, and closed-loop variants with the controller their capacitive, strain-gauge or encoder feedback requires. Matching connectors do not guarantee electrical compatibility.
- Load and mounting
- Max. Load: 250 g
- Check the load rating in the orientation you will use it — a vertical or cantilevered load is a moment, not a mass — and match the base to an M6 pattern on a 25 mm grid or a 1/4"-20 pattern on a 1 inch grid.
- Vacuum and cryogenic rating
- Option 1 - 30 mK: .ULT / .UHV.ULT
- Use only the environmental suffix listed for the ordered configuration, and treat cabling, lubricant, bakeout and thermal anchoring as part of the same specification.
Technical FAQ
Integration questions for Scanner25-z.Ultra.UHV.ULT
What travel and resolution does the Scanner25-z.Ultra.UHV.ULT provide?
Travel range: @300 K: 55 um; @4 K: 30 um · Resolution: 0.5 nm. Separate travel from resolution and both from repeatability. Repeatability is what an automated sequence actually depends on, and it is the figure most often absent from a headline specification.
Which controller does the Scanner25-z.Ultra.UHV.ULT require?
Sensor: Capacitive displacement sensor. Pair open-loop mechanics with the specified high-voltage or inertial driver, and closed-loop variants with the controller their capacitive, strain-gauge or encoder feedback requires. Matching connectors do not guarantee electrical compatibility.
What load can the Scanner25-z.Ultra.UHV.ULT carry, and how does it mount?
Max. Load: 250 g. Check the load rating in the orientation you will use it — a vertical or cantilevered load is a moment, not a mass — and match the base to an M6 pattern on a 25 mm grid or a 1/4"-20 pattern on a 1 inch grid.
Is the Scanner25-z.Ultra.UHV.ULT rated for vacuum or cryogenic use?
Option 1 - 30 mK: .ULT / .UHV.ULT. Use only the environmental suffix listed for the ordered configuration, and treat cabling, lubricant, bakeout and thermal anchoring as part of the same specification.
Specifying this part
What this model has to survive, and what it needs around it
What the capacitive loop buys you
An integrated capacitive displacement sensor closes the loop at 0.5 nm and lets the controller compensate thermal drift, piezoelectric creep and self-heating actively. Worth the extra wiring only if the measurement holds position for hours; if the sample is re-found optically each run, open-loop costs less heat.
Reading the HV / UHV / ULT suffixes
The suffix sets the environmental preparation, not the mechanics: HV, UHV, ULT and UHV.ULT variants differ in materials, cabling and bake compatibility. Match it to the chamber the stage will live in — the mechanical specification is identical across them.
Heat load at the cold plate
Stick-slip inertial drives dissipate energy per step and draw no holding current once stopped, so the steady-state load on the mixing chamber is the wiring loom rather than the motor. Anchor the loom at each temperature stage and thermalise the moving body with an FTC copper braid.
Non-magnetic construction
Titanium bodies (BeCu on the .ULT variants) and BeCu fasteners throughout, rated for operation to 35 T and down to 30 mK with the .ULT option, at 2 × 10⁻¹¹ mbar with .UHV. A single steel screw substituted at installation is enough to compromise a high-field assembly.
Full series comparison, controller pairing and mounting hardware on the cryogenic piezo stages overview, or work through the selection with the configurator.
Model selection
Nearby series comparison
Compare Scanner25-z.Ultra.UHV.ULT with the closest available models in the Cryogenic Piezo Stages - Closed-loop Ultra scanners family.
| Selection parameter | Scanner25-z.Ultra.UHV.ULT (current) | Scanner25-z.Ultra.UHV | Scanner25-z.Ultra.ULT |
|---|---|---|---|
| Travel / adjustment | @300 K: 55 um; @4 K: 30 um | @300 K: 55 um; @4 K: 30 um | @300 K: 55 um; @4 K: 30 um |
| Resolution / sensitivity | 0.5 nm | 0.5 nm | 0.5 nm |
Related products
Scanner25-x.Ultra
Closed-loop Ultra X-axis scanner; 25 x 25 x 10.5 mm body; 55 um range per axis at 300 K, 30 um at 4 K; 250 g payload; integrated capacitive displacement sensor, 0.5 nm resolution, ~0.1 % linearity, <5 nm repeatability; max. 75 V @300 K / 150 V @4 K; standard cryogenic environment grade; use with MC-ArchimedesLT.03.Ultra controller.
Scanner25-x.Ultra.HV
Closed-loop Ultra X-axis scanner; 25 x 25 x 10.5 mm body; 55 um range per axis at 300 K, 30 um at 4 K; 250 g payload; integrated capacitive displacement sensor, 0.5 nm resolution, ~0.1 % linearity, <5 nm repeatability; max. 75 V @300 K / 150 V @4 K; high-vacuum HV environment grade; use with MC-ArchimedesLT.03.Ultra controller.
Scanner25-x.Ultra.UHV
Closed-loop Ultra X-axis scanner; 25 x 25 x 10.5 mm body; 55 um range per axis at 300 K, 30 um at 4 K; 250 g payload; integrated capacitive displacement sensor, 0.5 nm resolution, ~0.1 % linearity, <5 nm repeatability; max. 75 V @300 K / 150 V @4 K; ultra-high-vacuum UHV environment grade; use with MC-ArchimedesLT.03.Ultra controller.
Scanner25-x.Ultra.ULT
Closed-loop Ultra X-axis scanner; 25 x 25 x 10.5 mm body; 55 um range per axis at 300 K, 30 um at 4 K; 250 g payload; integrated capacitive displacement sensor, 0.5 nm resolution, ~0.1 % linearity, <5 nm repeatability; max. 75 V @300 K / 150 V @4 K; ultra-low-temperature ULT grade down to 30 mK; use with MC-ArchimedesLT.03.Ultra controller.
