FI-RXF100-RE
FI-RXF100-RE FTIR Emission Spectrometer
A standalone FTIR spectrometer for infrared emission spectroscopy, with an integrated emission platform for accessories and reference blackbodies, two detector positions and a focused or parallel beam path. 500–5000 cm⁻¹ as standard, extendable to 12500 cm⁻¹.
500–5000 cm⁻¹
Standard range
12500 cm⁻¹
Near-IR extension, up to
2 cm⁻¹
Resolution, better than
12 kg
Weight
Overview
About the FI-RXF100-RE
Infrared emission spectroscopy obtains spectral information from a material directly and non-destructively, and complements transmission, reflection, ATR and diffuse reflectance. Because the sample itself is the infrared source, it reaches cases the other methods cannot: surfaces unsuited to transmission, highly corrosive or opaque samples, the spectral characteristics of emitting sources, large objects, distant targets, ultra-high-temperature samples and plasmas.
The FI-RXF100-RE is a standalone FTIR emission spectrometer with an integrated emission platform that takes different emission accessories and reference blackbodies, for characterising materials at different temperatures. The main unit has two detector positions for switching between detectors at any time, and the beam path can be set up focused or parallel to suit the sample. Internal optics can also be exchanged to extend the range into the near-infrared, for emission measurements of near-infrared sources.
Features
- Interferometer: advanced Michelson interferometer, permanently aligned beam path, excellent stability
- Solid-state laser: stable performance, service life over 10 years
- Emission source: focused beam path; the user’s sample, a heat source or a blackbody
- Beamsplitter: ZnSe beamsplitter and ZnSe windows, protected against moisture (KBr or quartz beamsplitter optional)
- Detectors: two built-in detector positions — room-temperature detector, or cooled MCT or InGaAs — switched automatically by the software
- Beam path: dedicated, compact emission optics that reduce radiation losses and raise throughput
- Emission accessories: customised to the measurement
Applications
- Emission spectra of materials
- Emissivity calculation
- Emission from burning moxa
- Emission spectra of ceramic plates at different temperatures
- Testing of physiotherapy devices
- Testing of (near-)infrared sources
- Spectra of ultra-high-temperature samples
- Plasma emission
- Emission studies of acupuncture points
- Emission of glass and building materials
- Emission of solar collector tubes
- Emission of textiles
Measurement notes
How an emission measurement is made depends on the form of the sample:
- Thin films: mount the film on a metal substrate to reduce emission from the substrate
- Keep samples thin and gas concentrations low, to avoid spectral distortion from self-absorption
- Where background radiation is strong, subtract it before calculating the emissivity of the sample
- If the sample releases gas during the measurement, add a purge to the emission set-up to limit its effect on the spectrum
Emissivity at room temperature
For materials at room temperature there is another route: measure the reflectance spectrum with an FI-RXF series spectrometer and a reflection or integrating-sphere accessory, then obtain the emissivity of opaque materials from Kirchhoff’s law and conservation of energy. Ask us for details of this method.
Technical Specifications
FI-RXF100-RE Specifications
Spectrometer
| Spectral range | 500–5000 cm⁻¹ standard; 400–7500 cm⁻¹ or 400–10000 cm⁻¹ optional, or extended into the near-infrared to 12500 cm⁻¹ |
|---|---|
| Spectral resolution | Better than 2 cm⁻¹; 8 cm⁻¹ is typically used |
| Measurement | Sample placed at the focal point; choice of temperature controllers or blackbodies |
| Operating conditions | −5 to 40 °C; 0–100 % RH |
| Power | 100–240 V AC, 50–60 Hz, 20 W |
| Weight | 12 kg |
| Dimensions (W × D × H) | 44 × 33 × 18 cm, including the emission shield |
Reference blackbody IR-563/301
| Temperature range | 50–1050 °C |
|---|---|
| Temperature control accuracy | 0.1 °C |
| Maximum aperture | 1 inch |
| Emissivity | > 0.99 |
| Source type | Cavity blackbody |
| Apertures | 8 selectable apertures |
Figures
Photos, Drawings and Spectra
Datasheet
Full specification sheet for the FI-RXF100-RE.
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