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Inspect, measure and process · Industry, inspection & flow

3D scanning & dimensional inspection

Turn a projected line into a calibrated surface profile.

3D scanning & dimensional inspection laser application
Application focusLine width & sampling
01 / Resolve

Line width & sampling

Match the line profile, camera pixels and smallest surface feature.

02 / Cover

Field & depth range

Choose fan angle and working distance for the full measurement volume.

03 / Measure

Surface contrast

Balance wavelength, exposure and reflected light without saturation.

Why the source matters

A camera observes the projected line across the surface to measure shape, height, flatness and dimensions with a calibrated triangulation geometry.

The correct source is defined at the sample or process—not at the laser aperture. Wavelength and operating mode set the interaction; stability, delivery, timing, and control determine whether it stays useful in the complete system.

Light inSelect a listed wavelength from 375–1550 nm to match the surface and camera
InteractionIlluminate or process
ResultLine width & sampling

Application workflow

Design from the result backward.

Three decisions turn the application into a practical source specification.

01

Define the measurement volume

Set field width, standoff, height range, required resolution and scan speed. Calibrate the camera and laser geometry over that volume.

02

Choose the line profile

Specify fan angle, usable line length, width and uniformity at the working distance. Test the real surface, including dark and reflective areas.

03

Coordinate acquisition

Match line power and modulation to camera exposure and motion. Validate profile accuracy, repeatability and background rejection on representative parts.

Selection guide

Match the architecture to the experiment.

These are starting architectures. Precisometer qualifies the final wavelength, output, delivery, control, and integration package against your setup.

Wavelength band
Select a listed wavelength from 375–1550 nm to match the surface and camera
Operating mode
CW line projection with TTL or analog modulation
A

Compact scanner

OEM-MF suits a compact instrument when the mounting, driver and thermal path are designed together.

B

Faster acquisition

MDL-III offers up to 100 kHz modulation with PSU-A-D; other listed drivers are limited to 30 kHz.

C

Integrated electronics

MDL-XR-Line combines the driver and active temperature control in a 24 V DC head, with optional RS232.

Ready to specify

Bring us the application—not a guessed model number.

Specify field width, working distance, depth range, smallest feature, scan speed, surface finish, camera response and required line width.

Compare line lasers