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SLM, narrow linewidth, coherence

780780 nm near-infrared narrow-linewidth single-frequency laser

780 nm

780 is a 780 nm Single-Frequency laser. Used for optical microscope, photon imaging, physics experiment. M²: <1.5. Key specifications: output / average power 1~80 mW, spectral linewidth <50 MHz optional, optical noise <0.5%. View specifications, datasheet and enquiry options from Precisometer.

Specifications

780

4 specification rows

Wavelength780 nm
Output / average power1~80 mW
Spectral linewidth<50 MHz optional
Optical noise<0.5%
<1.5

Series-level technical context

Engineering context for a thin Single-Frequency Lasers record

This model has no standalone PDF and only a small number of model-specific rows. The values below are traceable context from 113 nearby configurations on the same source-product record; they define the parameters to qualify, but are not substituted for an order-specific datasheet.

Typical operating fields in the series

  • Output / average power: 1~30 mW
  • Output / average power: 1~50 mW
  • Output / average power: 50~300 mW
  • Operating mode: CW
  • Spectral linewidth: <1 MHz

Beam-quality tolerance context

Nearby series records state M²: <1.5, M²: <1.2, Beam divergence, full angle (mrad): <1.0, and Beam divergence, full angle (mrad): <1.2. These are series context, not guaranteed values for 780; confirm them on the order-specific datasheet.

Optical integration schematic

  1. Step 1Laser head and temperature-stabilized base
  2. Step 2Safety shutter and optional optical isolator
  3. Step 3Beam steering, expansion or fiber-launch optics
  4. Step 4Experiment input with wavelength-matched coatings

Application context

Why this design is used

Applications named on a datasheet for this product line, interpreted against this model’s listed wavelength and beam data.

Optical microscope

780: 780 nm emission can be matched to the absorption or excitation band used in Optical microscope. The stated stability or noise figure (<0.5%) helps keep measured intensity changes attributable to the sample rather than source drift.

Photon imaging

780: 780 nm emission can be matched to the absorption or excitation band used in Photon imaging. The stated stability or noise figure (<0.5%) helps keep measured intensity changes attributable to the sample rather than source drift.

Physics experiment

780: Physics experiment benefits from a stable, focusable source. 780 nm emission fixes the compatible coatings and detector response, while the listed beam characteristic (<1.5) informs waist size and propagation.

System integration

Integration and compatibility

Use these checks to connect 780 to the surrounding optical, mechanical and control system. Every value shown is taken from this model's own specification record.

Beam parameters at the output
M²: <1.5
Size the downstream optics from the stated beam diameter and divergence rather than from the aperture of the housing, and confirm the polarisation state before specifying isolators or polarising optics.

Technical FAQ

Integration questions for 780

What beam does the 780 deliver?

M²: <1.5. Size the downstream optics from the stated beam diameter and divergence rather than from the aperture of the housing, and confirm the polarisation state before specifying isolators or polarising optics.

Need this configured?

Share wavelength, operating mode, output power or pulse energy, linewidth or pulse width, delivery, control, and safety requirements and we will qualify the matching configuration and lead time.

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Model selection

Nearby series comparison

Compare 780 with the closest available models in the Single-Frequency Lasers family. Confirm option-dependent values on the final configuration before ordering.

Selection parameter780 (current)MSL-T-780MSL-III-780L
Wavelength780 nm780 nm780 nm
Optical power / pulse energy1~80 mW1~300 mW1~80 mW
Operating mode / pulse widthConfirm for this modelConfirm for this modelCW
Beam quality<1.5<0.5~2.0