Back to Home
Precisometer · Official representative

X-ray detectors

X-ray Laue Back-Scattered Camera

A back-reflection detector with a central beam path for real-time Laue diffraction and crystal orientation.

X-ray Laue Back-Scattered Camera

Representative manufacturer photograph; housing and connectors depend on the selected configuration. Select the photograph to enlarge.

Standard input
155 × 105 mm
Sampling
2570 × 1710 pixels; 61.1 µm effective pitch
Geometry
Central hole for incident X-ray beam

From photon to signal

Response for your configuration.

Full specifications

A detector QE curve is not published in the Laue camera sheet. The active area, effective pixel size, exposure and crystal-orientation performance are specified below; precision depends on the complete source, mechanics and analysis configuration.

The details behind the selection

Full technical specifications.

Compare sensor configurations, coating options, operating limits and integration details directly below. Check the operating mode and temperature alongside each performance value.

01

Laue diffraction detector specifications

13 parameters
Laue diffraction detector specifications
ParameterPublished specification
Active inputApproximately 155 (H) × 105 (V) mm
Pixel format2570 × 1710
Effective square pixel size61 µm
Digitisation14-bit fast imaging mode
Exposure selection1 ms to 35 minutes
Beam passageThrough-camera X-ray beam; collimated to <1 mm diameter
Sensitivity modesOn-chip pixel addition trades spatial resolution for sensitivity
CorrectionsAutomatic background subtraction and flat-fielding
SoftwarePSEL acquisition and Laue image processing
OrientationDown to 0.1° with the appropriate system
MisalignmentDown to 0.5° using PSEL
Mechanical upgradesExisting-source upgrades can use precision mechanics for accuracy down to 0.05°
Heavy-duty sample optionUp to 20 kg; system configuration dependent

Key Features

  • Large active area for capturing a broad solid angle of diffraction
  • High resolution and high X-ray sensitivity
  • Single crystal orientation down to 0.1 degrees accuracy using PSEL software
  • Selectable exposure from 1ms to 15 minutes
  • On-chip pixel binning gives increased sensitivity at the expense of resolution
  • 18-bit high precision acquisition mode
  • 14-bit fast preview mode
  • Automatic background subtraction mode
  • On chip pixel addition allowing increased sensitivity at the expense of resolution
  • PSEL acquisition Laue image processing software

Build your enquiry

Start with the detector.

Choose a published configuration, add the integration topics you want to discuss, and keep the exact model in your enquiry.

X-ray Laue Back-Scattered Camera configuration and enquiry
Your starting configuration

X-ray Laue 155 × 105

Sensor / coating
Fibre-coupled CCD
Pixels
2570 × 1710
Pixel pitch
61.1 µm effective
Active input
155 × 105 mm
Interface
GigE
Optical / mechanical interface
Back-reflection geometry with central beam hole
Spectral response
X-ray Laue diffraction; scintillator dependent
Shutter / sensor readout
CCD

Selected options are requirements for discussion. Compatibility and final performance are confirmed for your configuration.

Review enquiry

Discuss selection, integration and a quotation with Precisometer.

Technical overview

Designed around the measurement.

A back-reflection detector with a central beam path for real-time Laue diffraction and crystal orientation.

Crystal orientationTurbine blade inspectionWafer grain mapping
X-ray Laue Back-Scattered Camera technical overview
Standard input155 × 105 mm
Sampling2570 × 1710 pixels; 61.1 µm effective pitch
GeometryCentral hole for incident X-ray beam

Explore the wider range

Other routes to your measurement.

All Photonic Science products
Product selection

What do you need to measure?

Start with your signal, or search directly for a camera, sensor option or application.

6 product ranges · 15 camera configurations

X-ray sCMOS FDS
Photonic Science / X-ray detectors

X-ray sCMOS FDS

Direct fibre-optic coupling protects the sensor while preserving detail in compact, high-resolution X-ray imaging.

Standard configurations
FDS 1.77MP_17_S, 2.86MP_11_S and 7.01MP_17_S
Acquisition
10–37 fps, model dependent
3 configurations · specifications
X-ray sCMOS 4MP
Photonic Science / X-ray detectors

X-ray sCMOS 4MP

A cooled 4-megapixel detector platform with three optical input sizes for laboratory and beamline X-ray imaging.

Resolution
2048 × 2048 pixels
Input sizes
22.5, 48 or 67.2 mm square
3 configurations · specifications
X-ray sCMOS 64MP
Photonic Science / X-ray detectors

X-ray sCMOS 64MP

A large-area X-ray detector built around four fibre-coupled 16MP sCMOS sensors.

Architecture
Four 16MP sCMOS sensors with fibre-optic coupling
Acquisition
Over 5 fps full resolution; subarea / line modes available
1 configurations · specifications
Laue-LT

Representative equipment; the complete configuration depends on your application.

Photonic Science / Laue crystal orientation

Laue-LT

An integrated Laue diffraction system for crystal orientation, with a compact format and manual positioning as standard.

Orientation accuracy, down to
0.2°
Detector input
76 × 105 mm
Explore the solution