Laue-XT

An integrated Laue diffraction system for crystal orientation, with motorised alignment and automated analysis options.

Representative manufacturer photograph; housing and connectors depend on the selected configuration. Select the photograph to enlarge.

Orientation accuracy, down to: 0.1°
Detector input: 155 × 105 mm
Typical exposure: 1–30 s typical
Energy range on sample: 5–29 keV
Maximum sample envelope: 450 × 250 × 250 mm

From photon to signal

Response for your configuration.

Full specifications

A system-level QE curve is not published. Laue selection depends on beam energy, detector input, crystal geometry, exposure and orientation accuracy. The model and positioning tables below preserve those system specifications.

The details behind the selection

Full technical specifications.

Compare sensor configurations, coating options, operating limits and integration details directly below. Check the operating mode and temperature alongside each performance value.

Laue family — complete system comparison

8 parameters

Laue family — complete system comparison
Parameter	Laue-LT	Laue	Laue-XT
Typical exposure time	120–240 s	1–30 s	1–30 s
Maximum sample size (L × D × H)	50 × 50 × 26.5 mm	Horizontal: 250 × 250 × 40 mm; vertical: 250 × 150 × 40 mm	450 × 250 × 250 mm
Scanning area	Horizontal: 50 × 26.5 mm; vertical: 50 × 50 mm	Horizontal: 250 × 40 mm; vertical: 250 × 150 mm	250 × 250 mm
Beam size on sample	Adjustable down to 1 mm	450 µm; 250 µm fine focus	450 µm; 250 µm fine focus
Active detector input	76 × 105 mm	155 × 105 mm	155 × 105 mm
Orientation accuracy, down to	0.2°	0.1°	0.1°
Sample alignment camera	Not included	Included as standard	Included as standard
Energy range	5–50 keV	5–29 keV	5–29 keV

Laue / Laue-LT — positioning, mechanics & software comparison

25 parameters

Laue / Laue-LT — positioning, mechanics & software comparison
—	Laue	Laue-LT
Active Input Area (h) x (v) mm	≈ 155 x 105	≈ 76 x 105
Input Pixel Size of 61.1 µm square	2570 x 1710	1285 x 1710
Detector Exposure Time Range	1 ms to 15 min	1 ms to 15 min
Pixel Binning Option	✓	✓
Typical Exposure Time Ranges	1 s - 30 s	120 s - 240 s
Pixel Binning from 1x1 to 8x8	✓	✓
Crystal Orientation Down to Accuracy	0.1°	0.2°
Solution from Random Si Orientation	≈ 5 s	≈ 5 s
Alignment Camera (top viewing of the sample)	✓	×
Laser Distance Measurement Tool	✓	Pointer arm
Motorised Axis Z: +/- 20 mm, X: +/- 25 mm, Y: +/- 100 mm adjustments with 20 microns accuracy and maximum 10kg load capacity	✓	Manual stages as standard; Maximum Y movement of +/- 10 mm
Automated Point-Scanning Routines	✓	×
Motorised Goniometer and Rotation Axis	✓	Manual as standard
Beam Size on the Sample	450 µm	Adjustable down to 1 mm
Sealed X-ray Tube with Tungsten Target	✓	✓
Average Spectrum on Sample (Bremsstrahlung)	5 - 29 keV	5 - 50 keV
PSEL X-ray Generator Fast automatic ramp up/down procedures software controlled up to 50 kV and 1 mA: ie. 50W power	✓	✓
Forced-Air Cooling	✓	✓
Requires Single Mains Power Connection	✓	✓
Standard Build Cabinet Dimensions	W 689 x D 676 x H 800 mm	W 649 x D 450 x H 874 mm
Custom Workbench Cabinet mount with space for monitor, keyboard and mouse (150 x 75 x 83 cm)	✓	✓
Reference Si Sample	✓	✓
X-ray Source Alignment Camera	✓	×
PSEL Market-Leading Laue Software	✓	✓

The comparison sheet describes the configurations and options in that revision. The newer family brochure adds Laue-XT and the sample envelopes above; confirm selected positioning and cabinet options.

Included across the Laue family

Sealed X-ray tube with tungsten target
Reference silicon sample
Cabinet workbench with space for the PC and controls
PSEL Laue crystal-orientation software

Build your enquiry

Start with your application.

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Tell us about your experiment so we can specify the system with you.

Geometry
Vertical / horizontal; grain-map options on selected systemsPositioning
Manual or motorised XYZ stages and goniometer; model dependentSoftware
Peak indexing, orientation, misorientation and automated routines

Your experimental requirements (optional)

Your starting configuration

Laue-XT

Orientation accuracy, down to: 0.1°
Detector input: 155 × 105 mm
Typical exposure: 1–30 s typical
Energy range on sample: 5–29 keV
Maximum sample envelope: 450 × 250 × 250 mm

Selected options are requirements for discussion. Compatibility and final performance are confirmed for your configuration.

Review enquiry

Discuss selection, integration and a quotation with Precisometer.

Technical overview

Designed around the measurement.

An integrated Laue diffraction system for crystal orientation, with motorised alignment and automated analysis options.

Single-crystal orientationCrystal cutting & preparationTurbine bladesWafer orientation mapping

Laue-XT technical overview
Orientation accuracy, down to	0.1°
Detector input	155 × 105 mm
Typical exposure	1–30 s typical
Energy range on sample	5–29 keV
Maximum sample envelope	450 × 250 × 250 mm

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