HiperS-320iAberration-Free Imaging Spectrometer
By implementing a full focal plane aberration correction optical design, the HiperS-320i eliminates off-axis astigmatism across the entire sensor surface. This delivers superior multi-channel measurement capabilities, increased spectral resolution, and reliable, peak-accurate intensity measurements across large-format CCD and sCMOS detectors.
Key Technologies
Advanced Optomechanical Design
Engineered for high-end research applications including LIBS, Confocal Raman, Multi-track Fluorescence, and Transient Absorption Spectroscopy.
Multi-Port Configuration
Supports up to two automated entrance ports and two exit ports. Fully motorized optical path switching provides maximum experimental flexibility.
On-Axis Grating Turret
Grating rotation on the optical axis increases the active area of the diffraction gratings. Optimizes illumination efficiency and provides a 15% increase in grating utility.
Resolution Intensifier
A built-in optical intensifier module increases standard spectrometer resolution by up to 20%, concentrating photons into narrower, sharper peaks.
Intelligent Auto-Focus
Automatic focusing mirror adjusts positioning dynamically during grating rotation to maintain perfect focus and high spectral/spatial resolution.
Interactive Laboratory Demo
Performance Verification Plots
Explore the optical behavior of the HiperS-320i compared to standard Czerny-Turner layouts. Toggle the controls to visualize real performance characteristics.
Spectral Resolution Enhancement Module
Standard spectrographs encounter aberrations away from the center of the detector plane. The HiperS-320i incorporates a built-in Resolution Intensifier Module.
When engaged, this optical array optimizes the wave curvature. This reduces the spectral line Full Width at Half Maximum (FWHM) by approximately 20%.
Example: At 435.83 nm, the FWHM narrows from 0.120 nm down to 0.096 nm. This allows you to resolve closely spaced emission bands that would otherwise merge.
💡 Scientific Impact
By eliminating astigmatism, photons are not spread vertically across multiple pixel rows but are instead concentrated onto a minimal pixel footprint. This dramatically improves the Signal-to-Noise Ratio (SNR) and absolute limit of detection for weak fluorescence or Raman signals.
Specifications
Instrument Parameters
HiperS-320i Core Specs
| Focal Length | 320 mm |
| Aperture Ratio | f/4.4 |
| Scan Range (with 1200 g/mm) | 0 – 1430 nm |
| Resolution (PMT) | 0.06 nm |
| Resolution (CCD, 15 μm pixels) | 0.12 nm |
| Dispersion | 2.29 nm/mm |
| Wavelength Accuracy | ±0.2 nm |
| Wavelength Repeatability | ±0.025 nm |
| Step Size | 0.005 nm |
| Stray Light Rejection | 5 × 10⁻⁵ |
| Focal Plane Size | 29 mm (w) × 14 mm (h) |
| Optical Axis Height | 156.3 – 171.3 mm (adjustable) |
| Grating Dimensions | 68 mm × 68 mm |
| Grating Mount | On-Axis Triple Turret |
| Slit Configuration | 0.01 – 3.00 mm continuous manual slit (motorized optional). Height options: 2, 4, 14 mm. |
| Physical Dimensions | 591 × 460 × 260 mm (L × W × H) |
| Weight | 30 kg (excluding options) |
| Communication Interface | USB 2.0 / RS-232 |
Performance by Grating Selection
System performance (resolution, dispersion, spectral coverage) shifts depending on the groove density of the installed diffraction grating. The HiperS-320i turret fits up to 3 gratings.
| Grating | Disp. (nm/mm) | Scan (nm) | Res (PMT) | Res (CCD) | One-Shot (nm) |
|---|---|---|---|---|---|
| 2400 g/mm | 0.91 | 0 – 715 | 0.03 nm | 0.048 nm | 26.4 @30mm |
| 1800 g/mm | 1.39 | 0 – 953 | 0.04 nm | 0.073 nm | 40.3 @30mm |
| 1200 g/mm | 2.29 | 0 – 1430 | 0.06 nm | 0.12 nm | 66.4 @30mm |
| 600 g/mm | 4.87 | 0 – 2860 | 0.12 nm | 0.256 nm | 141.2 @30mm |
| 300 g/mm | 9.97 | 0 – 4290 | 0.24 nm | 0.523 nm | 289.1 @30mm |
| 150 g/mm | 20.13 | 0 – 11440 | 0.48 nm | 1.06 nm | 583.8 @30mm |
Note 1: Slit resolution measured at central wavelength of 435.83 nm, with a 10 μm slit width.
Note 2: CCD one-shot spectral range is computed for a typical 30 mm width CCD detector.
Note 3: Dispersion varies inversely with central wavelength settings.
Configurations
Typical Selection & Port Codes
Configure your HiperS-320i layout matching your detector and light source geometry.
| Model | Optomechanical Port Configuration |
|---|---|
| HiperS-3204i | Side entrance slit, double CCD exit ports |
| HiperS-3205i | Side entrance slit, front exit slit |
| HiperS-3206i | Side entrance slit, front CCD exit port |
| HiperS-3207i | Side entrance slit, double exit slits |
| HiperS-3208i | Side entrance slit, front CCD exit port and side exit slit |
| HiperS-3224i | Double entrance slits, double CCD exit ports |
| HiperS-3227i | Double entrance slits, double exit slits |
| HiperS-3228i | Double entrance slits, front CCD exit port and side exit slit |
| HiperS-3247i | Side entrance slit, double exit slits with UV coating |
| HiperS-3248i | Side entrance slit, front CCD exit port and side exit slit with UV coating |
Request Information & Quote
Our technical scientists provide tailored optomechanical solutions with no obligation. Contact us directly to receive design assistance and technical details.