Measurement
MDL-XD-655: Measurement benefits from a stable, focusable source. 655 nm emission fixes the compatible coatings and detector response, while M², divergence and pointing stability should be confirmed for the intended beam path.
Power stability, linewidth, beam quality
MDL-XD-655655 nm red CW laser
655 nmMDL-XD-655 is a 655 nm CW laser. Used for measurement, communication, spectrum analysis, laser projection. High Stability Red Laser. Key specifications: output / average power 3~4.5 W. View specifications, datasheet and enquiry options from Precisometer.
Specifications
MDL-XD-655
2 specification rows
| Wavelength | 655 nm |
|---|---|
| Output / average power | 3~4.5 W |
| Beam / notes | High Stability Red Laser |
Series-level technical context
Engineering context for a thin CW Lasers record
This model has no standalone PDF and only a small number of model-specific rows. The values below are traceable context from 9 nearby configurations on the same source-product record; they define the parameters to qualify, but are not substituted for an order-specific datasheet.
Typical operating fields in the series
- • Output / average power: 1~80 mW
- • Output / average power: 1~180 mW
- • Output / average power: 1~1000 mW
- • Operating mode: CW
- • Power stability (rms, 4 hours ± 3°C): <2%, <1%, <0.5%
Beam-quality tolerance context
Nearby series records state Beam divergence, full angle (mrad): <1.0, Beam divergence, full angle (mrad): <3.0, and Beam divergence, full angle (mrad): ~10 / ~20. These are series context, not guaranteed values for MDL-XD-655; confirm them on the order-specific datasheet.
Optical integration schematic
- Step 1Laser head and temperature-stabilized base
- Step 2Safety shutter and optional optical isolator
- Step 3Beam steering, expansion or fiber-launch optics
- Step 4Experiment input with wavelength-matched coatings
Application context
Why this design is used
Applications named on a datasheet for this product line, interpreted against this model’s listed wavelength and beam data.
Communication
MDL-XD-655: 655 nm emission must sit inside the fiber-component passband used for Communication; connector polish, fiber mode, linewidth and back-reflection tolerance should be specified as one optical interface.
Spectrum analysis
MDL-XD-655: 655 nm emission sets the excitation and detector-band choice for Spectrum analysis; linewidth and wavelength stability determine how cleanly weak spectral features can be separated from the laser line.
Laser projection
MDL-XD-655: 655 nm emission determines compatible optics, coatings and detectors for Laser projection. Beam quality, divergence and pointing stability should be checked against the experiment geometry.
Need this configured?
Share wavelength, operating mode, output power or pulse energy, linewidth or pulse width, delivery, control, and safety requirements and we will qualify the matching configuration and lead time.
Model selection
Nearby series comparison
Compare MDL-XD-655 with the closest available models in the CW Lasers family. Confirm option-dependent values on the final configuration before ordering.
| Selection parameter | MDL-XD-655 (current) | MDL-C-655 | MLL-III-655L |
|---|---|---|---|
| Wavelength | 655 nm | 655 nm | 655 nm |
| Optical power / pulse energy | 3~4.5 W | 1~80 mW | 1~180 mW |
| Operating mode / pulse width | Confirm for this model | Confirm for this model | CW |
| Beam quality | Confirm for this model | Confirm for this model | Near TEM00 |
Related cw lasers
Compare the MDL-XD-655 with nearby cw lasers across the wavelength range.
