Measurement & Safety
STA-LFNT
STA-LFNT Low-Frequency Noise Test System
Measure low-frequency and ultra-low-frequency noise, 1/f spectra and random-telegraph noise in photodetectors, sensors and emerging semiconductor devices. STA-LFNT combines a compact optical platform, low-noise current amplifier, spectrum analyser and microscope.
How the measurement works
Bias the device and acquire its electrical response in the selected low- or ultra-low-frequency mode. Compare repeated traces, average spectra and investigate defect- and trap-related current fluctuations.
Features
- Shielded fA-level current testing
- Repeated trace overlays
- BMP images and XLS data export
- DC/AC switching
- RMS, vector and peak processing; up to 500 averages
- Time-domain selection and 3 dB bandwidth fitting
- Online bad-point removal
Applications
- 1/f and RTN characterisation
- Photodetectors and two-dimensional material devices
- Sensors, photovoltaic devices and semiconductor research
Technical specifications
Current system specifications
| Parameter | Specification |
|---|---|
| Model | STA-LFNT |
| Bias voltage | ±10 V |
| Current resolution | <10 fA |
| Data sampling rate | 2 MS/s |
| High-speed current gain | 10^3-10^11 |
| Low-speed current gain | 10^5-10^14 |
| Low-frequency baseline noise | 2 × 10^-29 A²/Hz |
| Ultra-low-frequency baseline noise | 1 × 10^-31 A²/Hz |
| Low-frequency noise band | 1 Hz - 100 kHz |
| Ultra-low-frequency noise band | 0.01-10 Hz |
Configure your measurement
Include these details with your enquiry so we can match the instrument and accessories.
- Device current level and contact arrangement
- Required noise band and gain
- Bias conditions, shielding, optical excitation and averaging