PIV, confocal, wafer, marking systems
Semiconductor wafer inspection
Non-destructive or minimally invasive inspection of wafer surface topography, electrical properties, and internal structure, etc.
Specifications
Semiconductor wafer inspection
1 specification rows
| Beam / notes | Non-destructive or minimally invasive inspection of wafer surface topography, electrical properties, and internal structure, etc. |
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Need this configured?
Share wavelength, operating mode, output power or pulse energy, linewidth or pulse width, delivery, control, and safety requirements and we will qualify the matching configuration and lead time.